Analysis of Ti nanolayers irradiated with Xeq+ ions using synchrotron radiation based X-ray reflectometry [1]
R. Stachura, D. Banaś, A. Kubala-Kukuś, I. Stabrawa, P. Jagodziński, K. Szary, A. Foks, J. Braziewicz, J. Semaniak, M. Pajek, G. Aquilanti, I. Božičević Mihalić, M. Teodorczyk
Nuclear Instruments and Methods in Physics Research Section B 536 (2023), 126-131;
DOI: 10.1016/j.nimb.2023.01.006
Nauka [2]
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