Analysis of Ti nanolayers irradiated with Xeq+ ions using synchrotron radiation based X-ray reflectometry

R. Stachura, D. Banaś, A. Kubala-Kukuś, I. Stabrawa, P. Jagodziński, K. Szary, A. Foks, J. Braziewicz, J. Semaniak, M. Pajek, G. Aquilanti, I. Božičević Mihalić, M. Teodorczyk

Nuclear Instruments and Methods in Physics Research Section B 536 (2023), 126-131;

DOI: 10.1016/j.nimb.2023.01.006